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The sp2 peak, characteristic of aromatic carbon, features a strong asymmetry that changes with the curvature of the sample surface and, thus, cannot be neglected in spectral analysis. This option is designed to operate on survey spectra including a range of at least 0 - 1350 eV Binding Energy (XPS spectra) with a step size of 1eV A smaller energy1350 eV Binding Energy (XPS spectra) with a. These findings illustrate that both spectral line shapes and binding energy components must be considered in the analysis of potentially defective surfaces of carbon materials. The SurveyID provides automatic XPS peak identification and quantification from monochromatic survey spectramonochromatic survey spectra. With high-resolution XPS and XPS depth profiling, the spectral components arising from disordered carbon and surface-defect states can be distinguished from aromatic sp2 carbon. Controlled manipulation of such samples is performed by annealing, sputtering, and oxygen functionalization to identify different CC bonding states and assess the impact of the manipulations on spectral line shapes and their binding energy positions. In this work, an overview of extrinsic and intrinsic effects that influence the C 1s XPS spectra-for example, photon broadening or carbon–catalyst interaction-of various graphitic samples is presented. For example, if a peak, A, is half the height of another peak B, that means there were half as many electrons detected with the binding energy at A compared to the number of electrons detected with the binding energy at B. The shorter the peak, the less electrons represented. However, the analysis of XPS data-in particular the C 1s region-can be complex, impeding a straightforward evaluation of the data. Peaks from the XPS spectra give relative number of electrons with a specific binding energy. X-ray photoelectron spectroscopy (XPS) is a widely used technique for characterizing the chemical and electronic properties of highly ordered carbon nanostructures, such as carbon nanotubes and graphene.